Relative Specular Reflectance Measurement
With relative specular reflectance measurement, the reflectance is calculated from the strength ratio after comparing the light reflected from the reference sample with the light reflected from the measurement sample. As shown in the figure, the reflectance of the reference sample is taken to be 100%, and the reflectance of the sample with respect to this reference sample is measured. This method is often applied to the examination of semiconductors, optical materials and multi-layer films.
News / Events
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National American Chemical Society (Spring) 2024
March 18-20
Ernest N. Morial Convention Center
New Orleans, Louisiana
Booth # 2931
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Shimadzu’s New IRSpirit-X Series of Compact FTIR Spectrophotometers Provide High Performance and Sensitivity in a Space-Saving Design
IRSpirit-X is the smallest and lightest FTIR instrument from Shimadzu with a space-saving design that does not compromise on performance or expandability.
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New AIMsight Infrared Microscope Maximizes Automation to Improve Microsample Analysis
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New One-Of-A-Kind AIRsight™ Infrared/Raman Microscope Enables Acquisition of Complementary Molecular Information
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New IRXross™ FTIR Spectrophotometer Delivers High-End Sensitivity, Enhanced Resolution and High-Quality Data
Shimadzu Scientific Instruments introduces the IRXross™ Fourier Transform Infrared (FTIR) Spectrophotometer. This mid-level FTIR model achieves upper-end performance including high-level S/N ratio, resolution, measurement speed and ease of use.