Film Measurement Software
FLM-UVPC Film Thickness Measurement Software
This software calculates film thickness from the peak positions of the interference pattern caused by the film. Film thickness is calculated by the method of least square using the wavelengths of the all peaks and valleys within a specified wavelength range. For UV-2600 series/2700 series/3600/3600Plus series, SolidSpec series PC software (compatible OS:Windows 10 (64bit) / Windows 7 (64/32bit))
News / Events
-
National American Chemical Society (Spring) 2024
March 18-20
Ernest N. Morial Convention Center
New Orleans, Louisiana
Booth # 2931
-
Shimadzu’s New IRSpirit-X Series of Compact FTIR Spectrophotometers Provide High Performance and Sensitivity in a Space-Saving Design
IRSpirit-X is the smallest and lightest FTIR instrument from Shimadzu with a space-saving design that does not compromise on performance or expandability.
-
New AIMsight Infrared Microscope Maximizes Automation to Improve Microsample Analysis
-
New One-Of-A-Kind AIRsight™ Infrared/Raman Microscope Enables Acquisition of Complementary Molecular Information
-
New IRXross™ FTIR Spectrophotometer Delivers High-End Sensitivity, Enhanced Resolution and High-Quality Data
Shimadzu Scientific Instruments introduces the IRXross™ Fourier Transform Infrared (FTIR) Spectrophotometer. This mid-level FTIR model achieves upper-end performance including high-level S/N ratio, resolution, measurement speed and ease of use.