SPM-9700HT - Specs

Scanning Probe Microscope

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SPM-9700HT

Observation modes

Standard: Contact, Dynamic, Phase, Lateral Force (LFM), Force Modulation Optional: Magnetic Force (MFM), Current, Surface Potential (KFM)
Resolution

X, Y: 0.2 nm, Z: 0.01 nm
AFM head

Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates cantilever continuously, even while replacing samples. Detector: Photodetector
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