Energy Dispersive X-ray (EDX) fluorescence spectrometry is used to perform qualitative and quantitative analysis of samples by measuring re-emitted characteristic X-rays from elements. The ideal tool for non-destructive applications, EDX allows measurement of a wide variety of sample types, such as solids, powders, and thin films, in many different applications areas, including electronics, chemicals, and foods.
With X-ray Diffraction (XRD), samples are excited with x-rays at changing angles, and the emitted X-rays are detected as a function of angle. XRD measurements provide routine identification and quantification of crystal phases in powder and polycrystalline samples. Percent crystallinity, residual stress, crystallite size, lattice strain and thin film measurements are also possible.
The EDX-7000/8000 achieves high-speed, high-precision elemental analysis of various samples.
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated ...
With spirit of a pioneer of local analysis, mapping and 4 kW thin-window X-ray tube, Shimadzu brush ...
High speed and high precision vertical goniometer for various application.
One-Dimensional Fast Detector for X-Ray Diffractometers Achieves High-Sensitivity Analysis and High-Speed Measurement