SolidSpec - 3700/3700DUV
Three Detector Systems with Large Sample Compartment


- UV-VIS-NIR Spectroscopy Solution for Optics, Semiconductors and FPD Applications -

SolidSpec-3700/3700DUV
Shimadzu’s SolidSpec-3700/3700DUV spectrophotometers are top-of-the-line systems offering high sensitivity, deep UV measurement and large sample compartments. The SolidSpec-3700 and 3700DUV respond to the following requirements in the optical, semiconductor and FPD markets.

FPD:

High-sensitivity measurement in NIR and a large sample compartment for material evaluation

Semiconductors:

Deep UV measurement in accordance with shorter wavelength laser, and 12-inch wafer whole surface measurement

Optical communications:

High-sensitivity measurement of anti-reflection films in NIR

Optics:

High-sensitivity measurement from deep UV to NIR, and a large sample compartment

SolidSpec-3700/3700DUV Features

High Sensitivity

The SolidSpec-3700 and 3700DUV are the FIRST UV-VIS-NIR SPECTROPHOTOMETERS with THREE DETECTORS: a photomultiplier tube (PMT) detector for the ultraviolet and visible region; InGaAs and PbS detectors for the near-infrared region. The use of the InGaAs and PbS detectors makes the sensitivity in the near-infrared region significantly high.

Deep UV Measurement

The SolidSpec-3700DUV has the capability to measure the deep ultraviolet region down to 165nm(note) (or to 175nm with an integrating sphere) by purging both the optical and the sample compartment with nitrogen gas. Note) 165nm is the minimum wavelength for SolidSpec-3700DUV with its optical attachment, Direct Detection Unit DDU-DUV.

Large Sample Compartment

The large sample compartment (900W x 700D x 350H mm) allows large samples to be measured without destroying the sample. The vertical optical path makes it possible to measure large samples while keeping them horizontal. The whole sample area of 12 inches or 310 x 310 mm samples is measurable by mounting the automatic X-Y stage (option).

Optional Accessories

Direct Detection Unit DDU/DDU-DUV (for liquid/solid transmission measurements)
Automatic X-Y Stage (for automated measurement)
Large Specular Reflectance Attachment
Nitrogen Gas Flow Meter
Absolute Specular Reflectance Attachments (5°12°30°45°)
Sample Base Plate Integrating Sphere Set

Specifications

Hardware

Wavelength range SolidSpec-3700: 240-2600nm, 190-3300nm(when using Direct Detectiton Unit DDU)
SolidSpec-3700DUV: 175-2600nm, 165-3300nm (when using Direct Detection Unit DDU-DUV)
Spectral bandwidth
Spectral bandwidth UV/VIS: 0.1-8nm (8 steps)
NIR: 0.2-32nm (10 steps)
Resolution(*) 0.1nm
Wavelength accuracy(*) UV/VIS: ±0.2nm, NIR: ±0.8nm
Wavelength repeatability(*) UV/VIS: ±0.08nm, NIR: ±0.32nm
Stray light(*) Less than 0.00008% (220nm), less than 0.00005% (340nm) Less than 0.0005% (1420nm), less than 0.005%(2365nm)
Noise Under 0.0002Abs (500nm, SBW 8nm), Under 0.00005Abs (1500nm, SBW 8nm) determined under conditions of RMS value at 0Abs and 1second response. When using Direct Detection Unit DDU/DDU-DUV, Under 0.00005Abs(500nm,SBW 2nm),
Under 0.00008Abs(900nm, SBW 2nm), Under 0.00003Abs(1500nm,SBW 2nm) determined under condition of RMS value at 0Abs and 1 second response.
Photometric range -6 to 6Abs
Photometric system Double beam, direct ratio measuring system
Dimensions 1000W x 800D x 1200H mm, 170kg
(* Determined with Direct Detection Unit DDU)

All-in-one Software

UVProbe software for the SolidSpec-3700/3700DUV includes functions for spectrum measurement, quantitation, kinetics and a report generator. Multiple security and audit-trail functions ensure the reliability of data.

For Research Use Only. Not for use in diagnostic procedures.